Publication
Title
Alternative Metals: from ab initio Screening to Calibrated Narrow Line Models
Author
Abstract
We discuss the selection and assessment of alternative metals by a combination of ab initio computation of electronic properties, experimental resistivity assessments, and calibrated line resistance models. Pt-group metals as well as Nb are identified as the most promising elements, with Ru showing the best combination of material properties and process maturity. An experimental assessment of the resistivity of Ru, Ir, and Co lines down to similar to 30 nm(2) is then used to devise compact models for line and via resistance that can be compared to Cu predictions. The main advantage of alternative metals originates from the possibility for barrierless metallization.
Language
English
Source (journal)
Proceedings of the IEEE ... International Interconnect Technology Conference. - Piscataway, N.J, 1998, currens
Source (book)
IEEE International Interconnect Technology Conference (IITC), JUN 04-07, 2018, Santa Clara, CA
Publication
New york : Ieee , 2018
ISBN
978-1-5386-4337-2
978-1-5386-4337-2
DOI
10.1109/IITC.2018.8456484
Volume/pages
(2018) , p. 154-156
ISI
000468672900051
Full text (Publisher's DOI)
Full text (publisher's version - intranet only)
UAntwerpen
Faculty/Department
Research group
Publication type
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identifier
Creation 25.06.2019
Last edited 06.01.2025
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