Publication
Title
Material relaxation in chalcogenide OTS SELECTOR materials
Author
Abstract
Nature of the mobility-gap states in amorphous Ge-rich Ge50Se50 was found to be related to homopolar Ge bonds in the chains/clusters of Ge atoms. Threshold switching material suffers Ge-Ge bond concentration drift during material ageing, which can explain the observed reliability of the aGe(50)Se(50) selector devices. Strong Ge-N bonds were introduced to alleviate the observed instability.
Language
English
Source (journal)
Microelectronic engineering. - Amsterdam
Publication
Amsterdam : 2019
ISSN
0167-9317
DOI
10.1016/J.MEE.2019.110996
Volume/pages
215 (2019) , 5 p.
Article Reference
110996
ISI
000480665600008
Medium
E-only publicatie
Full text (Publisher's DOI)
Full text (publisher's version - intranet only)
UAntwerpen
Faculty/Department
Research group
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identifier
Creation 10.09.2019
Last edited 02.10.2024
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