Publication
Title
Combined characterization of silver halide photographic systems and their components by conventional and energy-filtering TEM/EELS, STEM/EDX, SEM, and image analysis techniques
Author
Language
English
Source (book)
Proceedings of the IS&T's 49th Annual Conference, May 19-24, 1996, Minneapolis, Minnesota, USA
Publication
Minneapolis, Minn. : 1996
Volume/pages
p. 46-50
UAntwerpen
Faculty/Department
Research group
Publication type
Affiliation
Publications with a UAntwerp address
External links
Record
Identification
Creation 08.10.2008
Last edited 12.09.2013
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