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Title
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Combined characterization of silver halide photographic systems and their components by conventional and energy-filtering TEM/EELS, STEM/EDX, SEM, and image analysis techniques
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Author
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Language
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English
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Source (book)
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Proceedings of the IS&T's 49th Annual Conference, May 19-24, 1996, Minneapolis, Minnesota, USA
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Publication
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Minneapolis, Minn.
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1996
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Volume/pages
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p. 46-50
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