Publication
Title
Imaging microanalysis of composite materials with a scanning ion microprobe
Author
Language
English
Source (book)
Proceedings of the 10th International Conference on Secondary Ion Mass Spectrometry SIMS X / Benninghoven, A. [edit.]
Publication
Chichester : Wiley , 1997
Volume/pages
p. 157-160
UAntwerpen
Faculty/Department
Research group
Publication type
Affiliation
Publications with a UAntwerp address
External links
Record
Identifier
Creation 08.10.2008
Last edited 07.10.2022
To cite this reference