Non-destructive depth profiling of anodic oxide layers on aluminium using electronprobe X-ray microanalysis

Publication

Title				Non-destructive depth profiling of anodic oxide layers on aluminium using electronprobe X-ray microanalysis

Author				Cuynen, E. de Laet, J. Terryn, H. van Espen, P.

Language				English

Source (book)				ECASIA 95 / Mathieu, H.J. [edit.]

Publication				Chichester : Wiley , 1996

Volume/pages				p. 851-854

UAntwerpen

Faculty/Department				Faculty of Sciences. Chemistry

Research group				Chemometrics (Mitac 3)
Publication type				H3 Book chapter

Affiliation				Publications with a UAntwerp address

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08.10.2008

Last edited

07.10.2022

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