Publication
Title
Large variation in temperature dependence of band-to-band tunneling current in tunnel devices
Author
Abstract
The observation of a significant temperature-dependent variation in the ${I}$ - ${V}$ characteristics of tunneling devices is often interpreted as a signature of a trap-assisted-tunneling dominated current. In this letter, we use a ballistic 2D quantum-mechanical simulator, calibrated using the measured temperature-dependent ${I}$ - ${V}$ characteristics of Esaki diodes, to demonstrate that the temperature dependence of band-to-band tunneling (BTBT) current can vary significantly in both Esaki diodes and tunnel FETs. The variation of BTBT current with temperature is impacted by doping concentration, gate voltage, possible presence of a highly-doped pocket at the tunnel junction, and material.
Language
English
Source (journal)
IEEE electron device letters
Publication
2019
ISSN
0741-3106
DOI
10.1109/LED.2019.2939668
Volume/pages
40 :11 (2019) , p. 1864-1867
ISI
000496192600040
Full text (Publisher's DOI)
Full text (publisher's version - intranet only)
UAntwerpen
Faculty/Department
Research group
Publication type
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identifier
Creation 09.12.2019
Last edited 02.01.2025
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