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Title
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Efficient phase contrast imaging in STEM using a pixelated detector. Part II: Optimisation of imaging conditions
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Author
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Abstract
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| In Part I of this series of two papers, we demonstrated the formation of a high efficiency phase contrast image at atomic resolution using a pixelated detector in the scanning transmission electron microscope (STEM) with ptychography. In this paper we explore the technique more quantitatively using theory and simulations. Compared to other STEM phase contrast modes including annular bright field (ABF) and differential phase contrast (DPC), we show that the ptychographic phase reconstruction method using pixelated detectors offers the highest contrast transfer efficiency and superior low dose performance. Applying the ptychographic reconstruction method to DPC segmented detectors also improves the detector contrast transfer and results in less noisy images than DPC images formed using difference signals. We also find that using a minimum array of 16 x 16 pixels is sufficient to provide the highest signal-to-noise ratio (SNR) for imaging beam sensitive weak phase objects. Finally, the convergence angle can be adjusted to enhance the contrast transfer based on the spatial frequencies of the specimen under study. (C) 2014 Elsevier B.V. All rights reserved |
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Language
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English
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Source (journal)
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Ultramicroscopy. - Amsterdam
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Source (book)
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PICO 2015: 3rd Conference on Frontiers of Aberration Corrected Electron, Microscopy, APR 19-23, 2015, Vaals, NETHERLANDS
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Publication
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Amsterdam
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Elsevier science bv
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2015
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ISSN
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0304-3991
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DOI
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10.1016/J.ULTRAMIC.2014.10.013
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Volume/pages
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151
(2015)
, p. 232-239
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ISI
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000351237800028
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Full text (Publisher's DOI)
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