Publication
Title
Measuring dynamic structural changes of nanoparticles at the atomic scale using scanning transmission electron microscopy
Author
Abstract
We propose a new method to measure atomic scale dynamics of nanoparticles from experimental high-resolution annular dark field scanning transmission electron microscopy images. By using the so-called hidden Markov model, which explicitly models the possibility of structural changes, the number of atoms in each atomic column can be quantified over time. This newly proposed method outperforms the current atom-counting procedure and enables the determination of the probabilities and cross sections for surface diffusion. This method is therefore of great importance for revealing and quantifying the atomic structure when it evolves over time via adatom dynamics, surface diffusion, beam effects, or during in situ experiments.
Language
English
Source (journal)
Physical review letters. - New York, N.Y., 1958, currens
Publication
New York, N.Y. : American Physical Society , 2020
ISSN
0031-9007 [print]
1079-7114 [online]
DOI
10.1103/PHYSREVLETT.124.106105
Volume/pages
124 :10 (2020) , 7 p.
Article Reference
106105
ISI
000519718100015
Pubmed ID
32216442
Medium
E-only publicatie
Full text (Publisher's DOI)
Full text (open access)
UAntwerpen
Faculty/Department
Research group
Project info
Picometer metrology for light-element nanostructures: making every electron count (PICOMETRICS).
Enabling science and technology through European electron microscopy (ESTEEM3).
Dose-efficient fusion of imaging and analytical techniques in scanning transmission electron microscopy.
Smart strategies to break the beam damage limits in transmission electron microscopy.
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identifier
Creation 19.03.2020
Last edited 12.12.2024
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