Publication
Title
Electron Bessel beam diffraction patterns, line scan of Si/SiGe multilayer
Author
Guzzinati, Giulio
Ghielens, Wannes
Mahr, Christoph
Béché, Armand
Rosenauer, Andreas
Calders, Toon
Verbeeck, Jo
Language
English
Related publication(s)
Electron Bessel beam diffraction for precise and accurate nanoscale strain mapping / Guzzinati, Giulio. - 2019
Publication
2019
DOI
10.5281/ZENODO.2566137
Volume/pages
Full text (Publisher's DOI)
https://doi.org/10.5281/ZENODO.2566137
image/svg+xml
UAntwerpen
Faculty/Department
Faculty of Sciences. Physics
Faculty of Sciences. Mathematics and Computer Science
Research group
ADReM Data Lab (ADReM)
Electron microscopy for materials research (EMAT)
Publication type
Dataset
Subject
Physics
Computer. Automation
Affiliation
Publications with a UAntwerp address
External links
Record
Identifier
Creation
26.05.2020
Last edited
04.03.2024
To cite this reference
https://hdl.handle.net/10067/1691140151162165141