Publication
Title
Analysis of internal stress build-up during deposition of nanocrystalline Ni thin films using transmission electron microscopy
Author
Language
English
Source (journal)
Thin solid films : an international journal on the science and technology of thin and thick films. - Lausanne, 1967, currens
Publication
Lausanne : 2020
ISSN
0040-6090 [print]
1879-2731 [online]
DOI
10.1016/J.TSF.2020.138076
Volume/pages
707 (2020) , p. 1-7
Article Reference
138076
ISI
000539312200011
Medium
E-only publicatie
Full text (Publisher's DOI)
Full text (open access)
Full text (publisher's version - intranet only)
UAntwerpen
Faculty/Department
Research group
Project info
Study of the fundamental mechanisms of nano-plasticity in asdeposited and hydrided nanocrystalline Pd thin films using highthroughput nanostatistical in-situ nanomechanical TEM testing.
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identifier
Creation 09.06.2020
Last edited 02.10.2024
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