Publication
Title
Extreme sparse X-ray computed laminography via convolutional neural networks
Author
Abstract
X-ray Computed Laminography (CL) is a well-known computed tomography technique to image the internal structure of flat objects. High-quality CL imaging requires, however, a large number of X-ray projections, resulting in long acquisition times. Reducing the number of acquired projections allows to speed up the acquisition process but decreases the quality of the reconstructed images. In this work, we investigate the use of Convolutional Neural Networks for processing volumes reconstructed from only four X-ray projections acquired at an inline CL scanning setup.
Language
English
Source (journal)
International Conference on Tools with Artificial Intelligence : [proceedings]. - [Los Alamitos, Calif.]
Source (book)
2020 IEEE 32nd International Conference on Tools with Artificial Intelligence (ICTAI), 9-11 November, 2020, Baltimore, MD, USA
Publication
[Los Alamitos, Calif.] : IEEE , 2020
ISSN
1082-3409
ISBN
978-1-7281-9228-4
DOI
10.1109/ICTAI50040.2020.00099
Volume/pages
p. 612-616
ISI
000649734800089
Full text (Publisher's DOI)
Full text (open access)
UAntwerpen
Faculty/Department
Research group
Project info
Next generation X-ray metrology for meeting industry standards (MetroFlex).
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identifier
Creation 12.02.2021
Last edited 30.10.2024
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