Publication
Title
Outlier detection for foot complaint diagnosis : modeling confounding factors using metric learning
Author
Abstract
Diagnosing foot complaints using plantar pressure videos is complicated by the presence of confounding factors (e.g. age, weight). Outlier detection could help with diagnosis, but these confounding factors result in data that is not independent and identically distributed (IID) with respect to a specific patient. To address this non-IID problem, we propose the modeling of confounding factors using metric learning. A distance metric is learned on the confounding factors in order to model their impact on the plantar pressures. This metric is then employed to weight plantar pressures from healthy controls when generating a patient-specific statistical baseline. Statistical parametric mapping is then used to compare the patient to this statistical baseline. We show that using metric learning reduces variance in these statistical baselines, which then improves the sensitivity of the outlier detection. These improvements in outlier detection get us one step closer to accurate computer-aided diagnosis of foot complaints.
Language
English
Source (journal)
IEEE intelligent systems / Institute of Electrical and Electronics Engineers. - New York, N.Y., 2001, currens
Publication
New York, N.Y. : IEEE Computer Society , 2021
ISSN
1541-1672 [print]
1941-1294 [online]
DOI
10.1109/MIS.2020.3046431
Volume/pages
36 :3 (2021) , p. 41-49
ISI
000672536900006
Full text (Publisher's DOI)
Full text (open access)
Full text (publisher's version - intranet only)
UAntwerpen
Faculty/Department
Research group
Project info
CAD WALK: Enabling Computer Aided Diagnosis of Foot Pathologies through the use of Metric Learning
Enabling Computer Aided Diagnosis of Foot Pathologies through the use of Metric Learning (CAD WALK).
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identifier
Creation 12.02.2021
Last edited 02.10.2024
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