Publication
Title
Introduction
Author
Language
English
Source (journal)
Advances in imaging and electron physics. - San Diego, Calif.
Source (book)
Advances in imaging and electron physics
Publication
San Diego, Calif. : Elsevier , 2021
ISSN
1076-5670
ISBN
978-0-12-824607-8
DOI
10.1016/BS.AIEP.2021.01.001
Volume/pages
217 , p. 1-28
Full text (Publisher's DOI)
Full text (publisher's version - intranet only)
UAntwerpen
Faculty/Department
Research group
Project info
Picometer metrology for light-element nanostructures: making every electron count (PICOMETRICS).
Enabling science and technology through European electron microscopy (ESTEEM3).
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Record
Identifier
Creation 04.05.2021
Last edited 04.03.2024
To cite this reference