Publication
Title
Efficient fitting algorithm
Author
Abstract
An efficient model-based estimation algorithm is introduced to quantify the atomic column positions and intensities from atomic-resolution (scanning) transmission electron microscopy ((S)TEM) images. This algorithm uses the least squares estimator on image segments containing individual columns fully accounting for overlap between neighboring columns, enabling the analysis of a large field of view. To provide end-users with this well-established quantification method, a user friendly program, StatSTEM, is developed which is freely available under a GNU public license. In this chapter, this efficient algorithm is applied to three different nanostructures for which the analysis of a large field of view is required.
Language
English
Source (journal)
Advances in imaging and electron physics. - San Diego, Calif.
Source (book)
Advances in imaging and electron physics
Publication
San Diego, Calif. : Elsevier , 2021
ISSN
1076-5670
ISBN
978-0-12-824607-8
DOI
10.1016/BS.AIEP.2021.01.003
Volume/pages
217 , p. 73-90
Full text (Publisher's DOI)
Full text (publisher's version - intranet only)
UAntwerpen
Faculty/Department
Research group
Project info
Picometer metrology for light-element nanostructures: making every electron count (PICOMETRICS).
Enabling science and technology through European electron microscopy (ESTEEM3).
Dose-efficient fusion of imaging and analytical techniques in scanning transmission electron microscopy.
Three-dimensional atomic modelling of functional nanocrystalline structures from a single viewing direction.
Bringing light atoms to light: precise characterization of light-atom nanostructures using transmission electron microscopy.
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Record
Identifier
Creation 04.05.2021
Last edited 04.03.2024
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