Publication
Title
Image-quality evaluation and model selection with maximum a posteriori probability
Author
Abstract
The maximum a posteriori (MAP) probability rule for atom column detection can also be used as a tool to evaluate the relation between scanning transmission electron microscopy (STEM) image quality and atom detectability. In this chapter, a new image-quality measure is proposed that correlates well with atom detectability, namely the integrated contrast-to-noise ratio (ICNR). Furthermore, the working principle of the MAP probability rule is described in detail showing a close relation to the principles of model-selection methods.
Language
English
Source (journal)
Advances in imaging and electron physics. - San Diego, Calif.
Source (book)
Advances in imaging and electron physics
Publication
San Diego, Calif. : Elsevier , 2021
ISSN
1076-5670
ISBN
978-0-12-824607-8
DOI
10.1016/BS.AIEP.2021.01.007
Volume/pages
217 , p. 215-242
Full text (Publisher's DOI)
Full text (publisher's version - intranet only)
UAntwerpen
Faculty/Department
Research group
Project info
Picometer metrology for light-element nanostructures: making every electron count (PICOMETRICS).
Enabling science and technology through European electron microscopy (ESTEEM3).
Dose-efficient fusion of imaging and analytical techniques in scanning transmission electron microscopy.
Three-dimensional atomic modelling of functional nanocrystalline structures from a single viewing direction.
Bringing light atoms to light: precise characterization of light-atom nanostructures using transmission electron microscopy.
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Record
Identifier
Creation 04.05.2021
Last edited 07.10.2022
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