Publication
Title
CAD-based scatter compensation for polychromatic reconstruction of additive manufactured parts
Author
Abstract
High density materials, such as metals, strongly scatter X-ray photons during X-ray Computed Tomography (CT) scans, which is detrimental to the quality of the reconstructed images. In this study, a scatter compensation method for X-ray CT, based on Monte-Carlo (MC) simulations from the object’s CAD model, is presented and employed in conjunction with polychromatic reconstructions. The estimation of the scatter contributions is accelerated by 1) reducing the number of simulated projections accordingly to the Nyquist theorem, 2) noise reduction 3) angular interpolation. The method was applied to enhance CT images of a steel object produced via Additive Manufacturing, whose CAD model is known. Results show that, in conjunction with polychromatic reconstruction, our method can efficiently reduce beam hardening, scattering artifacts and increase the contrast of defects within the object.
Language
English
Source (journal)
Proceedings. - Los Alamitos, Calif, 1994, currens
Source (book)
2021 IEEE International Conference on Image Processing (ICIP), 19-22 September, 2021, Anchorage, Alaska, USA
Publication
Los Alamitos, Calif : IEEE , 2021
ISSN
1522-4880
ISBN
978-1-6654-4115-5
978-1-6654-4115-5
DOI
10.1109/ICIP42928.2021.9506536
Volume/pages
p. 2948-2952
ISI
000819455103014
Full text (Publisher's DOI)
Full text (publisher's version - intranet only)
UAntwerpen
Faculty/Department
Research group
Project info
Next generation X-ray phasecontrast imaging for food quality and process engineering (FoodPhase).
Next generation X-ray metrology for meeting industry standards (MetroFlex).
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identifier
Creation 14.10.2021
Last edited 03.10.2024
To cite this reference