Publication
Title
Atom counting from a combination of two ADF STEM images
Author
Abstract
To understand the structure–property relationship of nanostructures, reliably quantifying parameters, such as the number of atoms along the projection direction, is important. Advanced statistical methodologies have made it possible to count the number of atoms for monotype crystalline nanoparticles from a single ADF STEM image. Recent developments enable one to simultaneously acquire multiple ADF STEM images. Here, we present an extended statistics-based method for atom counting from a combination of multiple statistically independent ADF STEM images reconstructed from non-overlapping annular detector collection regions which improves the accuracy and allows one to retrieve precise atom-counts, especially for images acquired with low electron doses and multiple element structures.
Language
English
Source (journal)
Ultramicroscopy. - Amsterdam
Publication
Amsterdam : 2024
ISSN
0304-3991
DOI
10.1016/J.ULTRAMIC.2023.113859
Volume/pages
255 (2024) , p. 1-10
Article Reference
113859
ISI
001089064200001
Pubmed ID
37778104
Full text (Publisher's DOI)
Full text (open access)
Full text (publisher's version - intranet only)
UAntwerpen
Faculty/Department
Research group
Project info
Picometer metrology for light-element nanostructures: making every electron count (PICOMETRICS).
Quantifying the dynamics of the 3D atomic structure using hidden Markov models in scanning transmission electron microscopy.
Boosting properties and stability of metal halide nanocrystals and derived heterostructures by innovative transmission electron microscopy.
CHIral symmetry breaking from Surface to Bulk: a multidisciplinary approach of the crystallization of achiral and chiral molecules (CHISUB).
Smart strategies to break the beam damage limits in transmission electron microscopy.
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identifier
Creation 27.11.2023
Last edited 24.05.2024
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