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Title
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A condensed history approach to X-ray dark field effects in edge illumination phase contrast simulations
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Author
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Abstract
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| X-ray dark field signals, measurable in many x-ray phase contrast imaging (XPCI) setups, stem from unresolvable microstructures in the scanned sample. This makes them ideally suited for the detection of certain pathologies, which correlate with changes in the microstructure of a sample. Simulations of x-ray dark field signals can aid in the design and optimization of XPCI setups, and the development of new reconstruction techniques. Current simulation tools, however, require explicit modelling of the sample microstructures according to their size and spatial distribution. This process is cumbersome, does not translate well between different samples, and considerably slows down simulations. In this work, a condensed history approach to modelling x-ray dark field effects is presented, under the assumption of an isotropic distribution of microstructures, and applied to edge illumination phase contrast simulations. It substantially simplifies the sample model, can be easily ported between samples, and is two orders of magnitude faster than conventional dark field simulations, while showing equivalent results.Clinical relevance— Dark field signal provides information on the microstructure distribution within the investigated sample, which can be applied in areas such as histology and lung x-ray imaging. Efficient simulation tools for this dark field signal aid in optimizing scanning setups, acquisition schemes and reconstruction techniques. |
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Language
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English
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Source (journal)
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IEEE Engineering in medicine and biology society conference proceedings
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Source (book)
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2023 45th Annual International Conference of the IEEE Engineering in Medicine & Biology Society (EMBC), 24-27 July 2023, Sydney, Australia
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Publication
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IEEE
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2023
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ISSN
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1557-170X
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ISBN
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979-83-503-2447-1
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DOI
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10.1109/EMBC40787.2023.10340826
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Volume/pages
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p. 1-4
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ISI
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001133788303173
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Pubmed ID
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38083284
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Full text (Publisher's DOI)
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Full text (open access)
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Full text (publisher's version - intranet only)
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