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Title
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Low-dose 4D-STEM tomography for beam-sensitive nanocomposites
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Author
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Abstract
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| Electron tomography is essential for investigating the three-dimensional (3D) structure of nanomaterials. However, many of these materials, such as metal-organic frameworks (MOFs), are extremely sensitive to electron radiation, making it difficult to acquire a series of projection images for electron tomography without inducing electron-beam damage. Another significant challenge is the high contrast in high-angle annular dark field scanning transmission electron microscopy that can be expected for nanocomposites composed of a metal nanoparticle and an MOF. This strong contrast leads to so-called metal artifacts in the 3D reconstruction. To overcome these limitations, we here present low-dose electron tomography based on four-dimensional scanning transmission electron microscopy (4D-STEM) data sets, collected using an ultrafast and highly sensitive direct electron detector. As a proof of concept, we demonstrate the applicability of the method for an Au nanostar embedded in a ZIF-8 MOF, which is of great interest for applications in various fields, including drug delivery. |
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Language
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English
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Source (journal)
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ACS materials letters. - Washington, D.C., 2019, currens
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Publication
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Washington, D.C.
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American Chemical Society
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2023
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ISSN
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2639-4979
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DOI
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10.1021/ACSMATERIALSLETT.3C01042
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Volume/pages
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6
:1
(2023)
, p. 165-173
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ISI
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001141178500001
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Full text (Publisher's DOI)
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Full text (publisher's version - intranet only)
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