Publication
Title
Low-dose 4D-STEM tomography for beam-sensitive nanocomposites
Author
Abstract
Electron tomography is essential for investigating the three-dimensional (3D) structure of nanomaterials. However, many of these materials, such as metal-organic frameworks (MOFs), are extremely sensitive to electron radiation, making it difficult to acquire a series of projection images for electron tomography without inducing electron-beam damage. Another significant challenge is the high contrast in high-angle annular dark field scanning transmission electron microscopy that can be expected for nanocomposites composed of a metal nanoparticle and an MOF. This strong contrast leads to so-called metal artifacts in the 3D reconstruction. To overcome these limitations, we here present low-dose electron tomography based on four-dimensional scanning transmission electron microscopy (4D-STEM) data sets, collected using an ultrafast and highly sensitive direct electron detector. As a proof of concept, we demonstrate the applicability of the method for an Au nanostar embedded in a ZIF-8 MOF, which is of great interest for applications in various fields, including drug delivery.
Language
English
Source (journal)
ACS materials letters. - Washington, D.C., 2019, currens
Publication
Washington, D.C. : American Chemical Society , 2023
ISSN
2639-4979
DOI
10.1021/ACSMATERIALSLETT.3C01042
Volume/pages
6 :1 (2023) , p. 165-173
ISI
001141178500001
Full text (Publisher's DOI)
Full text (publisher's version - intranet only)
UAntwerpen
Faculty/Department
Research group
Project info
3D Structure of nanomaterials under realistic conditions (REALNANO).
Picometer metrology for light-element nanostructures: making every electron count (PICOMETRICS).
Strain to stabilize metal halide PERovSkites: an Integrated effort from fundamentalS toopto-electronic applicaTions (PERsist).
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identifier
Creation 01.02.2024
Last edited 08.02.2024
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