Publication
Title
Element specific atom counting for heterogeneous nanostructures : combining multiple ADF STEM images for simultaneous thickness and composition determination
Author
Abstract
In this paper, a methodology is presented to count the number of atoms in heterogeneous nanoparticles based on the combination of multiple annular dark field scanning transmission electron microscopy (ADF STEM) images. The different non-overlapping annular detector collection regions are selected based on the principles of optimal statistical experiment design for the atom-counting problem. To count the number of atoms, the total intensities of scattered electrons for each atomic column, the so-called scattering cross-sections, are simultaneously compared with simulated library values for the different detector regions by minimising the squared differences. The performance of the method is evaluated for simulated Ni@Pt and Au@Ag core–shell nanoparticles. Our approach turns out to be a dose efficient alternative for the investigation of beam-sensitive heterogeneous materials as compared to the combination of ADF STEM and energy dispersive X-ray spectroscopy.
Language
English
Source (journal)
Ultramicroscopy. - Amsterdam
Publication
Amsterdam : 2024
ISSN
0304-3991
DOI
10.1016/J.ULTRAMIC.2024.113941
Volume/pages
259 (2024) , p. 1-10
Article Reference
113941
ISI
001205863200001
Pubmed ID
38387236
Full text (Publisher's DOI)
Full text (open access)
The author-created version that incorporates referee comments and is the accepted for publication version Available from 23.08.2024
Full text (publisher's version - intranet only)
UAntwerpen
Faculty/Department
Research group
Project info
Picometer metrology for light-element nanostructures: making every electron count (PICOMETRICS).
Quantifying the dynamics of the 3D atomic structure using hidden Markov models in scanning transmission electron microscopy.
CHIral symmetry breaking from Surface to Bulk: a multidisciplinary approach of the crystallization of achiral and chiral molecules (CHISUB).
Smart strategies to break the beam damage limits in transmission electron microscopy.
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identifier
Creation 13.03.2024
Last edited 06.07.2024
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