Title
Imaging time-of-flight SIMS (TOF-SIMS) surface analysis of halide distributions in complex silver halide microcrystalsImaging time-of-flight SIMS (TOF-SIMS) surface analysis of halide distributions in complex silver halide microcrystals
Author
Faculty/Department
Faculty of Sciences. Chemistry
Research group
Plasma, laser ablation and surface modeling - Antwerp (PLASMANT)
Publication type
conferenceObject
Publication
Chichester :Wiley, [*]
Source (book)
Proceedings of the 11th International Conference on SIMS and Related Techniques / Gillen, G. [edit.]
1
Carrier
E
Target language
English (eng)
Affiliation
University of Antwerp
Handle