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Title
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Imaging time-of-flight SIMS (TOF-SIMS) surface analysis of halide distributions in complex silver halide microcrystals
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Author
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Language
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English
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Source (book)
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Proceedings of the 11th International Conference on SIMS and Related Techniques / Gillen, G. [edit.]
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Publication
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Chichester
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Wiley
,
1998
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Volume/pages
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p. 871-874
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