Title
Surface analysis of silver halide microcrystals by imaging time-of-flight SIMS (TOF-SIMS) Surface analysis of silver halide microcrystals by imaging time-of-flight SIMS (TOF-SIMS)
Author
Faculty/Department
Faculty of Sciences. Chemistry
Publication type
conferenceObject
Publication
s.l. , [*]
Source (book)
Proceedings of the 50th Annual Conference of the Society for Imaging Science and Technology
ISI
A1997BJ88J00018
Carrier
E
Target language
English (eng)
Affiliation
University of Antwerp
E-info
http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:A1997BJ88J00018&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=ef845e08c439e550330acc77c7d2d848
Handle