Publication
Title
Surface analysis of silver halide microcrystals by imaging time-of-flight SIMS (TOF-SIMS)
Author
Language
English
Source (book)
Proceedings of the 50th Annual Conference of the Society for Imaging Science and Technology
Publication
s.l. : 1997
ISI
A1997BJ88J00018
UAntwerpen
Faculty/Department
Research group
Publication type
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 08.10.2008
Last edited 24.09.2017
To cite this reference