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Title
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Electron probe X-ray microanalysis for the assessment of homogeneity of candidate reference materials at the nanogram level
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Author
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Language
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English
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Source (journal)
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Microchimica acta. - Wien, 1966, currens
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Publication
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Wien
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Springer
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1998
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ISSN
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0026-3672
[print]
1436-5073
[online]
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DOI
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10.1007/BF01243051
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Volume/pages
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128
(1998)
, p. 207-213
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ISI
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000071438000010
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Full text (Publisher's DOI)
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