Title
Electron probe X-ray microanalysis for the assessment of homogeneity of candidate reference materials at the nanogram level Electron probe X-ray microanalysis for the assessment of homogeneity of candidate reference materials at the nanogram level
Author
Faculty/Department
Faculty of Sciences. Chemistry
Publication type
article
Publication
Wien ,
Source (journal)
Microchimica acta. - Wien
Volume/pages
128(1998) , p. 207-213
ISSN
0026-3672
ISI
000071438000010
Carrier
E
Target language
English (eng)
Full text (Publishers DOI)
Affiliation
University of Antwerp
E-info
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Handle