Imaging secondary ion mass spectrometry

Publication

Title				Imaging secondary ion mass spectrometry

Author				van Espen, P. Janssens, G.

Language				English

Source (book)				Electron microscopy: principles and fundamentals / Amelinckx, S. [edit.]

Publication				Weinheim : VCH , 1997

Volume/pages				p. 457-482

UAntwerpen

Faculty/Department				Faculty of Sciences. Chemistry

Research group				Chemometrics (Mitac 3)

Publication type				H3 Book chapter

Affiliation				Publications with a UAntwerp address

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Creation

08.10.2008

Last edited

07.10.2022

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