Title
Imaging secondary ion mass spectrometry Imaging secondary ion mass spectrometry
Author
Faculty/Department
Faculty of Sciences. Chemistry
Publication type
bookPart
Publication
Weinheim :VCH, [*]
Source (book)
Electron microscopy: principles and fundamentals / Amelinckx, S. [edit.]
Carrier
E
Target language
English (eng)
Affiliation
University of Antwerp
Handle