|
Title
|
|
|
|
Growth of erbium-silicide films on (100) silicon as characterised by electron microscopy and diffraction
| |
|
Author
|
|
|
|
| |
|
Language
|
|
|
|
English
| |
|
Source (journal)
|
|
|
|
Journal of crystal growth. - Amsterdam
| |
|
Publication
|
|
|
|
Amsterdam
:
1997
| |
|
ISSN
|
|
|
|
0022-0248
| |
|
Volume/pages
|
|
|
|
172
(1997)
, p. 175-182
| |
|
ISI
|
|
|
|
A1997WL48900024
| |
|
Full text (Publisher's DOI)
|
|
|
|
| |
|