Publication
Title
Growth of erbium-silicide films on (100) silicon as characterised by electron microscopy and diffraction
Author
Language
English
Source (journal)
Journal of crystal growth. - Amsterdam
Publication
Amsterdam : 1997
ISSN
0022-0248
DOI
10.1016/S0022-0248(96)00745-2
Volume/pages
172 (1997) , p. 175-182
ISI
A1997WL48900024
Full text (Publisher's DOI)
UAntwerpen
Faculty/Department
Research group
Publication type
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identifier
Creation 08.10.2008
Last edited 23.08.2022
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