Publication
Title
Defect characterization in high temperature implanted 6H-SiC using TEM
Author
Language
English
Source (journal)
Nuclear instruments and methods in physics research: B
Publication
1997
Volume/pages
127/128(1997), p. 347-349
ISI
A1997XG60500078
Full text (Publishers DOI)
UAntwerpen
Faculty/Department
Research group
Publication type
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 08.10.2008
Last edited 10.04.2017
To cite this reference