Title
Intrinsic point defect clustering in Si: a study by HVEM and HREM in situ electron irradiation
Author
Faculty/Department
Faculty of Sciences. Physics
Publication type
bookPart
Publication
s.l. :Kluwer Academic, [*]
Source (book)
In-situ microscopy in materials research: leading international research in electron and scanning probe microscopies / Pratibha, L. Gai [edit.]
Carrier
E
Target language
English (eng)
Affiliation
University of Antwerp
Handle