Publication
Title
Intrinsic point defect clustering in Si: a study by HVEM and HREM in situ electron irradiation
Author
Language
English
Source (book)
In-situ microscopy in materials research: leading international research in electron and scanning probe microscopies / Pratibha, L. Gai [edit.]
Publication
s.l. : Kluwer Academic, 1997
Volume/pages
p. 63-92
UAntwerpen
Faculty/Department
Research group
Publication type
Affiliation
Publications with a UAntwerp address
External links
Record
Identification
Creation 08.10.2008
Last edited 10.07.2013
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