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Title
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Intrinsic point defect clustering in Si: a study by HVEM and HREM in situ electron irradiation
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Author
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Language
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English
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Source (book)
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In-situ microscopy in materials research: leading international research in electron and scanning probe microscopies / Pratibha, L. Gai [edit.]
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Publication
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s.l.
:
Kluwer Academic
,
1997
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Volume/pages
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p. 63-92
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