Publication
Title
HREM study of ion implantation in 6H-SiC at high temperatures
Author
Language
English
Source (journal)
Journal of electron microscopy. - Tokyo, 1953 - 2012
Publication
Tokyo : 1997
ISSN
0022-0744 [print]
1477-9986 [online]
Volume/pages
46:4(1997), p. 271-279
UAntwerpen
Faculty/Department
Research group
Publication type
Affiliation
Publications with a UAntwerp address
External links
Record
Identification
Creation 08.10.2008
Last edited 10.07.2013
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