Publication
Title
Surface analysis of halide distributions in complex AgX microcrystals by imaging time-of-flight SIMS (TOF-SIMS)
Author
Language
English
Source (book)
Proc. Intern. Congr. Imaging Sci. (ICPS'98); vol. 1
Publication
Antwerp : 1998
Volume/pages
p. 528-532
UAntwerpen
Faculty/Department
Research group
Publication type
Affiliation
Publications with a UAntwerp address
External links
Record
Identification
Creation 08.10.2008
Last edited 10.07.2013
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