Title
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Surface analysis of halide distributions in complex AgX microcrystals by imaging time-of-flight SIMS (TOF-SIMS)
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Author
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Language
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English
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Source (book)
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Proc. Intern. Congr. Imaging Sci. (ICPS'98); vol. 1
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Publication
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Antwerp
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1998
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Volume/pages
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p. 528-532
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