Title
Surface analysis of halide distributions in complex AgX microcrystals by imaging time-of-flight SIMS (TOF-SIMS) Surface analysis of halide distributions in complex AgX microcrystals by imaging time-of-flight SIMS (TOF-SIMS)
Author
Faculty/Department
Faculty of Sciences. Chemistry
Publication type
bookPart
Publication
Antwerp , [*]
Source (book)
Proc. Intern. Congr. Imaging Sci. (ICPS'98); vol. 1
Carrier
E
Target language
English (eng)
Affiliation
University of Antwerp
Handle