|
Title
|
|
|
|
Surface analysis of halide distributions in complex AgX microcrystals by imaging time-of-flight SIMS (TOF-SIMS)
| |
|
Author
|
|
|
|
| |
|
Language
|
|
|
|
English
| |
|
Source (book)
|
|
|
|
Proc. Intern. Congr. Imaging Sci. (ICPS'98); vol. 1
| |
|
Publication
|
|
|
|
Antwerp
:
1998
| |
|
Volume/pages
|
|
|
|
p. 528-532
| |
|