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Publication
Title
Characterization of nano particles by TEM and STEM
Author
de Vyt, A.
Gijbels, R.
Davock, H.
van Roost, C.
Geuens, I.
Language
English
Source (journal)
Journal of analytical atomic spectrometry. - London
Publication
London
:
1999
ISSN
0267-9477
DOI
10.1039/A807695B
Volume/pages
14 (1999) , p. 499-504
ISI
000079138500027
Full text (Publisher's DOI)
https://doi.org/10.1039/A807695B
UAntwerpen
Faculty/Department
Faculty of Sciences. Chemistry
Publication type
A1 Journal article
Affiliation
Publications with a UAntwerp address
External links
Web of Science
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Record
Identifier
c:irua:24927
Creation
08.10.2008
Last edited
28.08.2024
To cite this reference
https://hdl.handle.net/10067/249270151162165141
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