Publication
Title
Characterization of nano particles by TEM and STEM
Author
Language
English
Source (journal)
Journal of analytical atomic spectrometry. - London
Publication
London : 1999
ISSN
0267-9477
Volume/pages
14 (1999) , p. 499-504
ISI
000079138500027
Full text (Publisher's DOI)
UAntwerpen
Faculty/Department
Research group
Publication type
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identifier
Creation 08.10.2008
Last edited 02.01.2022
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