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Title
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Surface analysis of halide distributions in complex AgX microcrystals by imaging time-of-flight SIMS (TOF-SIMS)
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Author
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Language
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English
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Source (journal)
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Journal of analytical atomic spectrometry. - London
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Publication
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London
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1999
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ISSN
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0267-9477
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DOI
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10.1039/A807276K
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Volume/pages
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14
(1999)
, p. 429-434
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ISI
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000079138500015
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Full text (Publisher's DOI)
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