Publication
Title
Surface analysis of halide distributions in complex AgX microcrystals by imaging time-of-flight SIMS (TOF-SIMS)
Author
Language
English
Source (journal)
Journal of analytical atomic spectrometry. - London
Publication
London : 1999
ISSN
0267-9477
Volume/pages
14(1999), p. 429-434
ISI
000079138500015
Full text (Publisher's DOI)
UAntwerpen
Faculty/Department
Research group
Publication type
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 08.10.2008
Last edited 15.06.2017
To cite this reference