Title
Quantitative secondary ion mass spectrometry depth profiling of surface layers of cubic silver halide microcrystals Quantitative secondary ion mass spectrometry depth profiling of surface layers of cubic silver halide microcrystals
Author
Faculty/Department
Faculty of Sciences. Chemistry
Publication type
article
Publication
New York, N.Y. ,
Source (journal)
Journal of the American Society for Mass Spectrometry. - New York, N.Y.
Volume/pages
10(1999) , p. 1016-1027
ISSN
1044-0305
ISI
000082614500013
Carrier
E
Target language
English (eng)
Full text (Publishers DOI)
Affiliation
University of Antwerp
E-info
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Handle