Publication
Title
Quantitative secondary ion mass spectrometry depth profiling of surface layers of cubic silver halide microcrystals
Author
Language
English
Source (journal)
Journal of the American Society for Mass Spectrometry. - New York, N.Y.
Publication
New York, N.Y. : 1999
ISSN
1044-0305
Volume/pages
10(1999), p. 1016-1027
ISI
000082614500013
Full text (Publisher's DOI)
UAntwerpen
Faculty/Department
Research group
Publication type
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 08.10.2008
Last edited 20.11.2017
To cite this reference