Title
Quantitative secondary ion mass spectrometry depth profiling of surface layers of cubic silver halide microcrystals
Author
Faculty/Department
Faculty of Sciences. Chemistry
Publication type
article
Publication
New York, N.Y. ,
Source (journal)
Journal of the American Society for Mass Spectrometry. - New York, N.Y.
Volume/pages
10(1999) , p. 1016-1027
ISSN
1044-0305
ISI
000082614500013
Carrier
E
Target language
English (eng)
Full text (Publishers DOI)
Affiliation
University of Antwerp
E-info
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Handle