Publication
Title
Quantitative secondary ion mass spectrometry depth profiling of surface layers of cubic silver halide microcrystals
Author
Language
English
Source (journal)
Journal of the American Society for Mass Spectrometry. - New York, N.Y.
Publication
New York, N.Y. : 1999
ISSN
1044-0305 [print]
1879-1123 [online]
Volume/pages
10 (1999) , p. 1016-1027
ISI
000082614500013
Full text (Publisher's DOI)
UAntwerpen
Faculty/Department
Research group
Publication type
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identifier
Creation 08.10.2008
Last edited 02.01.2022
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