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Title
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Quantitative secondary ion mass spectrometry depth profiling of surface layers of cubic silver halide microcrystals
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Author
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Language
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English
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Source (journal)
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Journal of the American Society for Mass Spectrometry. - New York, N.Y.
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Publication
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New York, N.Y.
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1999
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ISSN
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1044-0305
[print]
1879-1123
[online]
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Volume/pages
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10
(1999)
, p. 1016-1027
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ISI
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000082614500013
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Full text (Publisher's DOI)
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