Publication
Title
XPS and TOFSIMS studies of shallow layers
Author
Language
English
Source (journal)
Thin solid films. - Amsterdam : Elsevier, 1967
Publication
Amsterdam : Elsevier : 1999
ISSN
1879-2731
Volume/pages
343/344(1999), p. 583-586
ISI
000081103100149
Full text (Publisher's DOI)
UAntwerpen
Faculty/Department
Research group
Publication type
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 08.10.2008
Last edited 06.06.2017
To cite this reference