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Title
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XPS and TOFSIMS studies of shallow layers
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Author
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Language
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English
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Source (journal)
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Thin solid films : an international journal on the science and technology of thin and thick films. - Lausanne, 1967, currens
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Publication
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Lausanne
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1999
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ISSN
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0040-6090
[print]
1879-2731
[online]
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DOI
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10.1016/S0040-6090(99)00122-4
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Volume/pages
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343/344
(1999)
, p. 583-586
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ISI
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000081103100149
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Full text (Publisher's DOI)
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