Patents and trademarks as indicators of international competitiveness: the ECM versus the hysteresis approach

Publication

Title				Patents and trademarks as indicators of international competitiveness: the ECM versus the hysteresis approach

Author				Meeusen, W. Rayp, G.

Language				English

Source (series)				CESIT-paper , 98-04

Publication				s.l. : 1998

UAntwerpen

Faculty/Department				Faculty of Business and Economics

Research group
Publication type				Minutes and reports

Affiliation				Publications with a UAntwerp address

External links

Record

Identifier

Creation

08.10.2008

Last edited

04.03.2024

To cite this reference