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Title
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Static secondary ion mass spectrometry (S-SIMS): part 2: applications in materials science
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Author
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Language
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English
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Source (journal)
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Mass spectrometry reviews. - New York, N.Y., 1982, currens
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Publication
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New York, N.Y.
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1999
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ISSN
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0277-7037
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DOI
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10.1002/(SICI)1098-2787(1999)18:1<48::AID-MAS2>3.0.CO;2-I
10.1002/(SICI)1098-2787(1999)18:1<48::AID-MAS2>3.3.CO;2-9
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Volume/pages
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18
(1999)
, p. 48-81
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ISI
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000082318900002
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Full text (Publisher's DOI)
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