Publication
Title
Static secondary ion mass spectrometry (S-SIMS): part 2: applications in materials science
Author
Language
English
Source (journal)
Mass spectrometry reviews. - New York, N.Y., 1982, currens
Publication
New York, N.Y. : 1999
ISSN
0277-7037
Volume/pages
18(1999), p. 48-81
ISI
000082318900002
Full text (Publisher's DOI)
UAntwerpen
Faculty/Department
Research group
Publication type
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 08.10.2008
Last edited 20.08.2017
To cite this reference