Publication
Title
Static secondary ion mass spectrometry (S-SIMS): part 2: applications in materials science
Author
Language
English
Source (journal)
Mass spectrometry reviews. - New York, N.Y., 1982, currens
Publication
New York, N.Y. : 1999
ISSN
0277-7037
DOI
10.1002/(SICI)1098-2787(1999)18:1<48::AID-MAS2>3.0.CO;2-I
10.1002/(SICI)1098-2787(1999)18:1<48::AID-MAS2>3.3.CO;2-9
Volume/pages
18 (1999) , p. 48-81
ISI
000082318900002
Full text (Publisher's DOI)
UAntwerpen
Faculty/Department
Research group
Publication type
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identifier
Creation 08.10.2008
Last edited 04.03.2024
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