Publication
Title
Thin layer thickness measurements based on the acousto-optic technique
Author
Language
English
Source (journal)
Applied physics letters / American Institute of Physics. - New York, N.Y., 1962, currens
Publication
New York, N.Y. : American Institute of Physics, 1996
ISSN
0003-6951 [print]
1077-3118 [online]
Volume/pages
68:12(1996), p. 1732-1734
ISI
A1996UA59700047
Full text (Publisher's DOI)
UAntwerpen
Faculty/Department
Research group
Publication type
External links
Web of Science
Record
Identification
Creation 08.10.2008
Last edited 12.06.2017