Title
Thin layer thickness measurements based on the acousto-optic techniqueThin layer thickness measurements based on the acousto-optic technique
Author
Faculty/Department
Faculty of Applied Economics
Research group
Faculteit Toegepaste Economische Wetenschappen
Publication type
article
Publication
New York, N.Y. :American Institute of Physics,
Source (journal)
Applied physics letters / American Institute of Physics. - New York, N.Y., 1962, currens
Volume/pages
68(1996):12, p. 1732-1734
ISSN
0003-6951
1077-3118
ISI
A1996UA59700047
Carrier
E
Target language
English (eng)
Full text (Publishers DOI)
E-info
http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:A1996UA59700047&DestLinkType=RelatedRecords&DestApp=ALL_WOS&UsrCustomerID=ef845e08c439e550330acc77c7d2d848
http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:A1996UA59700047&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=ef845e08c439e550330acc77c7d2d848
http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:A1996UA59700047&DestLinkType=CitingArticles&DestApp=ALL_WOS&UsrCustomerID=ef845e08c439e550330acc77c7d2d848