Publication
Title
SIMS and XPS characterization of CdS/CdTe heterostructures grown by MBE
Author
Language
English
Source (journal)
Nuclear instruments and methods in physics research: B: beam interactions with materials and atoms. - Amsterdam
Publication
Amsterdam : 2000
ISSN
0168-583X
Volume/pages
161/163(2000), p. 975-979
ISI
000086204100184
Full text (Publisher's DOI)
UAntwerpen
Faculty/Department
Research group
Publication type
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 08.10.2008
Last edited 19.07.2017
To cite this reference