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Title
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SIMS and XPS characterization of CdS/CdTe heterostructures grown by MBE
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Author
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Language
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English
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Source (journal)
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Nuclear instruments and methods in physics research: B: beam interactions with materials and atoms. - Amsterdam
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Publication
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Amsterdam
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2000
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ISSN
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0168-583X
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Volume/pages
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161/163
(2000)
, p. 975-979
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ISI
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000086204100184
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Full text (Publisher's DOI)
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