Title
Comparison of synchrotron X-ray microanalysis with electron and proton microscopy for individual particle analysisComparison of synchrotron X-ray microanalysis with electron and proton microscopy for individual particle analysis
Author
Faculty/Department
Faculty of Sciences. Chemistry
Research group
AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
Department of Chemistry - other
Publication type
article
Publication
New York, N.Y.,
Source (journal)
Advances in X-ray analysis. - New York, N.Y.
Volume/pages
35(1992), p. 1265-1273
ISSN
0376-0308
Carrier
E
Target language
English (eng)
Affiliation
University of Antwerp
Handle