Title
|
|
|
|
Comparison of synchrotron X-ray microanalysis with electron and proton microscopy for individual particle analysis
| |
Author
|
|
|
|
| |
Language
|
|
|
|
English
| |
Source (journal)
|
|
|
|
Advances in X-ray analysis. - New York, N.Y.
| |
Publication
|
|
|
|
New York, N.Y.
:
1992
| |
ISSN
|
|
|
|
0376-0308
| |
Volume/pages
|
|
|
|
35
(1992)
, p. 1265-1273
| |
|