Publication
Title
Comparison of synchrotron X-ray microanalysis with electron and proton microscopy for individual particle analysis
Author
Language
English
Source (journal)
Advances in X-ray analysis. - New York, N.Y.
Publication
New York, N.Y. : 1992
ISSN
0376-0308
Volume/pages
35(1992), p. 1265-1273
UAntwerpen
Faculty/Department
Research group
Publication type
Affiliation
Publications with a UAntwerp address
External links
Record
Identification
Creation 08.10.2008
Last edited 10.11.2015
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