Title
Quantification in XRF analysis of intermediate-thickness samples Quantification in XRF analysis of intermediate-thickness samples
Author
Faculty/Department
Faculty of Sciences. Chemistry
Publication type
bookPart
Publication
New York :Marcel Dekker, [*]
Source (book)
Handbook of X-ray spectroscopy / Grieken, van, R.E. [edit.]
General
Practical spectroscopy series, 14
Carrier
E
Target language
English (eng)
Affiliation
University of Antwerp
Handle