Title
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Quantification in XRF analysis of intermediate-thickness samples
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Author
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Language
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English
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Source (book)
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Handbook of X-ray spectroscopy / Grieken, van, R.E. [edit.]
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Publication
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New York
:
Marcel Dekker
,
1992
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Volume/pages
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p. 339-358
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Note
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Practical spectroscopy series, 14
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