Publication
Title
Conventional and HREM study of structural defects in nanostructured silver halides
Author
Schryvers, D.
Goessens, C.
van Renterghem, W.
van Landuyt, J.
de Keyzer, R.
Language
English
Source (book)
Proceedings of the International Congress on Imaging Science (ICPS'98)
Publication
Antwerpen
:
1998
Volume/pages
p. 1-6
UAntwerpen
Faculty/Department
Faculty of Sciences. Physics
Research group
Electron microscopy for materials research (EMAT)
Publication type
P3 Proceeding
Affiliation
Publications with a UAntwerp address
External links
Record
Identifier
Creation
08.10.2008
Last edited
07.10.2022
To cite this reference
https://hdl.handle.net/10067/296810151162165141