Conventional and HREM study of structural defects in nanostructured silver halides

Publication

Title				Conventional and HREM study of structural defects in nanostructured silver halides

Author				Schryvers, D. Goessens, C. van Renterghem, W. van Landuyt, J. de Keyzer, R.

Language				English

Source (book)				Proceedings of the International Congress on Imaging Science (ICPS'98)

Publication				Antwerpen : 1998

Volume/pages				p. 1-6

UAntwerpen

Faculty/Department				Faculty of Sciences. Physics

Research group				Electron microscopy for materials research (EMAT)

Publication type				P3 Proceeding

Affiliation				Publications with a UAntwerp address

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Record

Identification

Creation

08.10.2008

Last edited

07.03.2018

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