Title
High resolution electron microscopy and X-ray photoelectron spectroscopy studies of heteroepitaxial <tex>$Si_{x}Ge_{1-x}$</tex> alloys produced through laser induced processing High resolution electron microscopy and X-ray photoelectron spectroscopy studies of heteroepitaxial <tex>$Si_{x}Ge_{1-x}$</tex> alloys produced through laser induced processing
Author
Faculty/Department
Faculty of Sciences. Physics
Publication type
article
Publication
New York, N.Y. :American Institute of Physics ,
Source (journal)
Applied physics letters / American Institute of Physics. - New York, N.Y., 1962, currens
Volume/pages
72(1998) :22 , p. 2877-2879
ISSN
0003-6951
1077-3118
ISI
000075273700034
Carrier
E
Target language
English (eng)
Full text (Publishers DOI)
Affiliation
University of Antwerp
E-info
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