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Title
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The time of '**guessing**' your failure time distribution is over!
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Author
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Language
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English
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Source (journal)
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Microelectronics and reliability. - Oxford
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Publication
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Oxford
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1998
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ISSN
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0026-2714
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Volume/pages
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38
(1998)
, p. 1187-1191
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ISI
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000076454300056
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Full text (Publisher's DOI)
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