Publication
Title
High-resolution X-ray fluorescence microtomography of homogeneous samples
Author
Language
English
Source (journal)
IEEE transactions on nuclear science. - New York, N.Y.
Publication
New York, N.Y. : 2000
ISSN
0018-9499
Volume/pages
47:6(2000), p. 2736-2740
ISI
000166992400006
Full text (Publisher's DOI)
UAntwerpen
Faculty/Department
Research group
Publication type
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 08.10.2008
Last edited 12.06.2017
To cite this reference