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Title
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High-resolution X-ray fluorescence microtomography of homogeneous samples
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Author
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Language
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English
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Source (journal)
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IEEE transactions on nuclear science. - New York, N.Y.
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Publication
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New York, N.Y.
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2000
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ISSN
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0018-9499
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DOI
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10.1109/23.901180
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Volume/pages
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47
:6
(2000)
, p. 2736-2740
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ISI
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000166992400006
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Full text (Publisher's DOI)
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