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Title
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SIMS/TOF-SIMS study of microparticles: surface analysis, imaging and quantification
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Author
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Language
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English
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Source (book)
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2nd International Union Microbeam Analysis Societies, Kailua-Kona, Hawaii, 9-13 July 2000
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Publication
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Bristol
:
London Institute of Physics
,
2000
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Volume/pages
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p. 331-332
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ISI
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000166835400166
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