Title
SIMS/TOF-SIMS study of microparticles: surface analysis, imaging and quantificationSIMS/TOF-SIMS study of microparticles: surface analysis, imaging and quantification
Author
Faculty/Department
Faculty of Sciences. Chemistry
Research group
Plasma, laser ablation and surface modeling - Antwerp (PLASMANT)
Publication type
bookPart
Publication
Bristol :London Institute of Physics, [*]
Source (book)
2nd International Union Microbeam Analysis Societies, Kailua-Kona, Hawaii, 9-13 July 2000
ISI
000166835400166
Carrier
E
Target language
English (eng)
Affiliation
University of Antwerp
E-info
http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:000166835400166&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=ef845e08c439e550330acc77c7d2d848
Handle