Publication
Title
SIMS/TOF-SIMS study of microparticles: surface analysis, imaging and quantification
Author
Language
English
Source (book)
2nd International Union Microbeam Analysis Societies, Kailua-Kona, Hawaii, 9-13 July 2000
Publication
Bristol : London Institute of Physics, 2000
Volume/pages
p. 331-332
ISI
000166835400166
UAntwerpen
Faculty/Department
Research group
Publication type
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 08.10.2008
Last edited 29.06.2017
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