Publication
Title
Study of oxynitrides with dual beam TOF-SIMS
Author
Language
English
Source (book)
Proceedings of the 12th International Conference on Secondary Ion Mass Spectrometry, Brussels, 5-11 September 1999 / Benninghoven, A. [edit.]
Publication
Amsterdam : Elsevier, 2000
Volume/pages
p. 611-614
UAntwerpen
Faculty/Department
Research group
Publication type
Affiliation
Publications with a UAntwerp address
External links
Record
Identification
Creation 08.10.2008
Last edited 12.09.2013
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