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Title
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Sensitivity analysis for non-random dropout: a local influence approach
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Author
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Language
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English
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Source (journal)
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Biometrics. - Washington, D.C.
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Publication
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Washington, D.C.
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2001
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ISSN
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0006-341X
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DOI
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10.1111/J.0006-341X.2001.00007.X
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Volume/pages
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57
(2001)
, p. 7-14
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ISI
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000167376900002
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Full text (Publisher's DOI)
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