Publication
Title
Sensitivity analysis for non-random dropout: a local influence approach
Author
Language
English
Source (journal)
Biometrics. - Washington, D.C.
Publication
Washington, D.C. : 2001
ISSN
0006-341X
Volume/pages
57(2001), p. 7-14
ISI
000167376900002
Full text (Publisher's DOI)
UAntwerpen
Faculty/Department
Research group
Publication type
External links
Web of Science
Record
Identification
Creation 08.10.2008
Last edited 16.06.2017