Quantification in XRF analysis of intermediate-thickness samples

Publication

Title				Quantification in XRF analysis of intermediate-thickness samples

Author				Markowicz, Andrzej A. Van Grieken, René E.

Language				English

Source (book)				Handbook of X-ray spectrometry / Grieken, van, René E. [edit.]

Publication				Nwe York : Dekker , 2002

Volume/pages				p. 407-431

Edition				2 ed.

UAntwerpen

Faculty/Department				Faculty of Sciences. Chemistry

Publication type				H3 Book chapter

Affiliation				Publications with a UAntwerp address

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Creation

08.10.2008

Last edited

04.03.2024

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