Title
Quantification in XRF analysis of intermediate-thickness samples Quantification in XRF analysis of intermediate-thickness samples
Author
Faculty/Department
Faculty of Sciences. Chemistry
Publication type
bookPart
Publication
Nwe York :Dekker, [*]
Source (book)
Handbook of X-ray spectrometry / Grieken, van, René E. [edit.]
Edition
2 ed.
Carrier
E
Target language
English (eng)
Affiliation
University of Antwerp
Handle