Publication
Title
Quantification in XRF analysis of intermediate-thickness samples
Author
Language
English
Source (book)
Handbook of X-ray spectrometry / Grieken, van, René E. [edit.]
Publication
Nwe York : Dekker, 2002
Volume/pages
p. 407-431
Edition
2 ed.
UAntwerpen
Faculty/Department
Research group
Publication type
Affiliation
Publications with a UAntwerp address
External links
Record
Identification
Creation 08.10.2008
Last edited 23.12.2015
To cite this reference