|
Title
|
|
|
|
Modeling of the sputtering process of cubic silver halide microcrystals and its relevance in depth profiling by secondary ion-mass spectrometry (SIMS)
|
|
|
Author
|
|
|
|
|
|
|
Language
|
|
|
|
English
|
|
|
Source (journal)
|
|
|
|
Fresenius' journal of analytical chemistry. - Heidelberg, 1990 - 2001
|
|
|
Publication
|
|
|
|
Heidelberg
:
Springer
,
2001
|
|
|
ISSN
|
|
|
|
0937-0633
[print]
1432-1130
[online]
|
|
|
DOI
|
|
|
|
10.1007/S002160100880
|
|
|
Volume/pages
|
|
|
|
370
:5
(2001)
, p. 654-662
|
|
|
ISI
|
|
|
|
000170115200032
|
|
|
Full text (Publisher's DOI)
|
|
|
|
|
|