Title
Modeling of the sputtering process of cubic silver halide microcrystals and its relevance in depth profiling by secondary ion-mass spectrometry (SIMS)Modeling of the sputtering process of cubic silver halide microcrystals and its relevance in depth profiling by secondary ion-mass spectrometry (SIMS)
Author
Faculty/Department
Faculty of Sciences. Chemistry
Research group
Plasma, laser ablation and surface modeling - Antwerp (PLASMANT)
Mass Spectrometry (Mitac 5)
Department of Chemistry
Publication type
article
Publication
Berlin,
Source (journal)
Fresenius' journal of analytical chemistry. - Berlin, 1990 - 2001
Volume/pages
370(2001):5, p. 654-662
ISSN
0937-0633
ISI
000170115200032
Carrier
E
Target language
English (eng)
Full text (Publishers DOI)
Affiliation
University of Antwerp
E-info
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