Publication
Title
Photographic materials
Author
Language
English
Source (book)
TOF-SIMS: surface analysis by mass spectrometry / Vickerman, J. [edit.]
Publication
Chichester : Surface Spectra & IM , 2001
Volume/pages
p. 727-752
UAntwerpen
Faculty/Department
Publication type
Affiliation
Publications with a UAntwerp address
External links
Record
Identifier
Creation 08.10.2008
Last edited 04.03.2024
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