Title
Static secondary ion mass spectrometry as a new analytical tool for measuring atmospheric particles on insulating substratesStatic secondary ion mass spectrometry as a new analytical tool for measuring atmospheric particles on insulating substrates
Author
Faculty/Department
Faculty of Sciences. Chemistry
Research group
Mass Spectrometry (Mitac 5)
Department of Chemistry - other
Department of Chemistry
Publication type
article
Publication
Oxford,
Source (journal)
Atmospheric environment : an international journal. - Oxford, 1994, currens
Volume/pages
36(2002), p. 899-909
ISSN
1352-2310
ISI
000174064000013
Carrier
E
Target language
English (eng)
Affiliation
University of Antwerp
E-info
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Handle