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Title
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Static secondary ion mass spectrometry as a new analytical tool for measuring atmospheric particles on insulating substrates
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Author
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Language
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English
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Source (journal)
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Atmospheric environment : an international journal. - Oxford, 1994, currens
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Publication
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Oxford
:
2002
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ISSN
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1352-2310
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Volume/pages
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36
(2002)
, p. 899-909
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ISI
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000174064000013
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